GGR Biennial Review: Key Advances in Secondary Ion Mass Spectrometry in the Geological Sciences during the Period 2008-2009

Secondary ion mass spectrometry (SIMS or ion microprobe) remains one of the most powerful techniques in the analytical geochemist's toolkit. The key strength of SIMS is its capacity to provide trace element and isotope data at sampling sizes which are not approached by other methods. As compared with the main competing technique of laser ablation-ICP-MS, SIMS commonly provides a total sampling mass some 10 to 500 times smaller; this feature can be the deciding factor as to whether an analytical objective is technically achievable. Additional strengths of SIMS lie in the areas of depth profiling and trace element imaging. Though perhaps not as commonly used in the geosciences, these two operational modes represent unique capabilities of SIMS.