4.5 Article

Mutation Rates across Budding Yeast Chromosome VI Are Correlated with Replication Timing

期刊

GENOME BIOLOGY AND EVOLUTION
卷 3, 期 -, 页码 799-811

出版社

OXFORD UNIV PRESS
DOI: 10.1093/gbe/evr054

关键词

mutation rate; replication timing; DNA damage tolerance; budding yeast

资金

  1. National Institutes of Health (NIH)/National Institute of General Medicine Sciences (NIGMS) Centers of Excellence [P50 GM068763]
  2. NIH/NIGMS [GM043987]
  3. NATIONAL INSTITUTE OF GENERAL MEDICAL SCIENCES [P50GM068763, R01GM043987, R37GM043987] Funding Source: NIH RePORTER

向作者/读者索取更多资源

Previous experimental studies suggest that the mutation rate is nonuniform across the yeast genome. To characterize this variation across the genome more precisely, we measured the mutation rate of the URA3 gene integrated at 43 different locations tiled across Chromosome VI. We show that mutation rate varies 6-fold across a single chromosome, that this variation is correlated with replication timing, and we propose a model to explain this variation that relies on the temporal separation of two processes for replicating past damaged DNA: error-free DNA damage tolerance and translesion synthesis. This model is supported by the observation that eliminating translesion synthesis decreases this variation.

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