Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation

Digital image correlation (DIC) of images obtained using scanning electron microscopy has been used to study, quantitatively, the plastic deformation of stainless steel at the microstructural scale. An artificial speckle pattern was generated by the remodelling of a deposited gold layer. A new experimental setup was shown to accelerate the remodelling process and promote the formation of finer nano-scale speckles with sizes ranging 30 nm to 150 nm and of similar spacing. The effects of surface preparation on speckle morphology are discussed. The high density of speckles enabled displacement mapping with resolution of one displacement vector each 0.2 x 0.2 mu m(2) of surface area. It is shown that sub-micron resolution is necessary to capture the plastic deformation associated with the formation of slip bands in stainless steel, which are an important component of the deformation of these materials at the microscale. Electron backscatter diffraction (EBSD) was used to reconstruct the surface grain boundaries and enabled these deformation features to be linked to the microstructure.