相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams
Sadia Sheraz Nee Rabbani et al.
ANALYTICAL CHEMISTRY (2015)
High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry
Tina B. Angerer et al.
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY (2015)
Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials
Martin P. Seah et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2014)
On Universality in Sputtering Yields Due to Cluster Bombardment
Robert J. Paruch et al.
JOURNAL OF PHYSICAL CHEMISTRY LETTERS (2014)
A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry
Andreas Wucher et al.
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (2014)
Molecular imaging of biological tissue using gas cluster ions
Hua Tian et al.
SURFACE AND INTERFACE ANALYSIS (2014)
Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams
Sadia Sheraz nee Rabbani et al.
ANALYTICAL CHEMISTRY (2013)
Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples
Claudia Bich et al.
ANALYTICAL CHEMISTRY (2013)
Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection
T. Mouhib et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Dual beam depth profiling of polymer materials: comparison of C60 and Ar cluster ion beams for sputtering
D. Rading et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Sputtered ion emission under size-selected Arn+ cluster ion bombardment
Hubert Gnaser et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding
Klaus Wittmaack
SURFACE SCIENCE REPORTS (2013)
Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
Alexander G. Shard et al.
ANALYTICAL CHEMISTRY (2012)
TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+
Sadia Rabbani et al.
ANALYTICAL CHEMISTRY (2011)
MCs+ depth profiling using cluster primary ions
E. Niehuis et al.
SURFACE AND INTERFACE ANALYSIS (2011)
A new time-of-flight SIMS instrument for 3D imaging and analysis
Rowland Hill et al.
SURFACE AND INTERFACE ANALYSIS (2011)
Molecular sputter depth profiling using carbon cluster beams
Andreas Wucher et al.
ANALYTICAL AND BIOANALYTICAL CHEMISTRY (2010)
Salt Effects on Ion Formation in Desorption Mass Spectrometry: An Investigation into the Role of Alkali Chlorides on Peak Suppression in Time-of-Flight-Secondary Ion Mass Spectrometry
Alan M. Piwowar et al.
ANALYTICAL CHEMISTRY (2009)
Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams
Satoshi Ninomiya et al.
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (2009)
A New Dynamic in Mass Spectral Imaging of Single Biological Cells
John S. Fletcher et al.
ANALYTICAL CHEMISTRY (2008)
Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions?
XA Conlan et al.
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (2006)
Proton transfer in time-of-flight secondary ion mass spectrometry studies of frozen-hydrated dipalmitoylphosphatidylcholine
TP Roddy et al.
ANALYTICAL CHEMISTRY (2003)