期刊
ACS NANO
卷 9, 期 4, 页码 3772-3779出版社
AMER CHEMICAL SOC
DOI: 10.1021/nn5065716
关键词
chromium telluride; molecular beam epitaxy; scanning tunneling microscopy; ferromagnetic metal; spin glass; magnetoresistance; perpendicular magnetic anisotropy
类别
资金
- NRI SWAN Center
Reflection high-energy electron diffraction (RHEED), scanning tunneling microscopy (STM), vibrating sample magnetometry, and other physical property measurements are used to investigate the structure, morphology, magnetic, and magnetotransport properties of (001)-oriented Cr2Te3 thin films grown on Al2O3(0001) and Si(111)-(7x7) surfaces by molecular beam epitaxy. Streaky RHEED patterns indicate flat smooth film growth on both substrates. STM studies show the hexagonal arrangements of surface atoms. Determination of the lattice parameter from the atomically resolved STM image is consistent with the bulk crystal structures. Magnetic measurements show the film is ferromagnetic, having a Curie temperature of about 180 K, and a spin glass-like behavior was observed below 35 K. Magnetotransport measurements show the metallic nature of the film with a perpendicular magnetic anisotropy along the c-axis.
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