4.4 Review

Multiple ionization under strong XUV to X-ray radiation

期刊

EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS
卷 222, 期 9, 页码 2067-2084

出版社

SPRINGER HEIDELBERG
DOI: 10.1140/epjst/e2013-01987-7

关键词

-

向作者/读者索取更多资源

We review the main aspects of multiple photoionization processes in atoms exposed to intense, short wavelength radiation. The main focus is the theoretical framework for the description of such processes as well as the conditions under which direct multiphoton multiple ionization processes can dominate over the sequential ones. We discuss in detail the mechanisms available in different wavelength ranges from the infrared to the hard X-rays. The effect of field fluctuations, present at this stage in all SASE free-electron-laser (FEL) facilities, as well as the effect of the interaction volume integration, are also discussed.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据