4.5 Article

TXRF determination of indium at ultra trace levels in heavy water samples using In Kα as analytical line and continuum excitation

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SPRINGER
DOI: 10.1007/s10967-015-4180-8

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Heavy water; Reactors; Coolant; Moderator; TXRF

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A total reflection X-ray fluorescence method was developed to ascertain the absence of indium at a concentration level of > 1 ng/mL in heavy water samples. A continuum strip in the energy range of 25-35 keV was used for sample excitation and In K-alpha was used as analytical line. The detection limit for indium, obtained after preconcentration and continuum excitation, was found to be 1 ng/mL with a sample size of 2 mu L. A heavy water sample was analysed for indium using this approach.

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