4.4 Article

Microstructures and fatigue life of SnAgCu solder joints bearing Nano-Al particles in QFP devices

期刊

ELECTRONIC MATERIALS LETTERS
卷 10, 期 3, 页码 645-647

出版社

KOREAN INST METALS MATERIALS
DOI: 10.1007/s13391-014-3190-y

关键词

fatigue life; QFP device; solder joints; thermal cycling loading

资金

  1. Natural Science Foundation of Jiangsu Province [BK2012144]
  2. Natural Science Foundation of the Higher Education Institutions of Jiangsu Province [12KJB460005]
  3. Jiangsu Normal University Foundation [11XLR16]
  4. Jiangsu University of Science and Technology: Provincial Key Lab of Advanced Welding Technology Foundation [JSAWS-11-03]

向作者/读者索取更多资源

Microstructures and fatigue life of SnAgCu and SnAgCu bearing nano-Al particles in QFP (Quad flat package) devices were investigated, respectively. Results show that the addition of nano-Al particles into SnAgCu solder can refine the microstructures of matrix microstructure. Moreover, the nano-Al particles present in the solder matrix, act as obstacles which can create a back stress, resisting the motion of dislocations. In QFP device, it is found that the addition of nano-Al particles can increase the fatigue life by 32% compared with the SnAgCu solder joints during thermal cycling loading.

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