4.4 Review

Review Paper: Nano-Floating Gate Memory Devices

期刊

ELECTRONIC MATERIALS LETTERS
卷 7, 期 3, 页码 175-183

出版社

KOREAN INST METALS MATERIALS
DOI: 10.1007/s13391-011-0901-5

关键词

memory devices; nanoparticles; flash memory; organic transistors; flexible electronics

资金

  1. National Research Foundation (NRF)
  2. Korea government (MEST) [2010-0014925, 2010-0015014]
  3. MEST [2009-0077593]
  4. ERC of NRF/MEST [R11-2005-048-00000-0]
  5. National Research Foundation of Korea [2010-0014925, 2010-0015014, 2008-0060669, 2009-0077593] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

In recent decades, memory device technology has advanced through active research and the development of innovative technologies. Single transistor-based flash memory device is one of the most widely used forms of memory devices because their device structure is simple and the scaling is feasible. A nano-floating gate memory (NFGM) device is a kind of flash memory devices that uses nanocrystals as a charge-trapping element. The use of nanocrystals has advantages over memory devices that rely on other methods such as discontinuous trap sites and controllable trap levels. Nowadays considerable progress has been made in the field of NFGM devices, and novel application areas have been explored extensively. This review article focuses on new technologies that are advancing these developments. The discussion highlights recent efforts and research activities regarding the fabrication and characterization of nonvolatile memory devices that use a nanocrystal layer as a charge-trapping element. The review concludes with an analysis of device fabrication strategies and device architectures of NFGM devices for possible application to devices that are organic, printed, and flexible.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据