Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics

A facility utilizing 4-grid optics for LEED/AES (low energy electron diffraction/Auger electron spectroscopy) was developed to measure the total secondary electron yield and secondary electron energy distribution function for conducting materials. The facility and experimental procedure were validated with measurements of 50-500 eV primary electrons impacting graphite. The total yield was calculated from measurements of the secondary electron current (i) from the sample and (ii) from the collection assembly, by biasing each surface. Secondary electron yield results from both methods agreed well with each other and were within the spread of previous results for the total yield from graphite. Additionally, measurements of the energy distribution function of secondary electrons from graphite are provided for a wider range of incident electron energies. These results can be used in modeling plasma-wall interactions in plasmas bounded by graphite walls, such as are found in plasma thrusters, and divertors and limiters of magnetic fusion devices.