期刊
CURRENT APPLIED PHYSICS
卷 11, 期 3, 页码 409-413出版社
ELSEVIER
DOI: 10.1016/j.cap.2010.08.011
关键词
Ultrahigh dielectric constant; Electrical conductivity; SnO2 nanoparticles thick films
In this work, the electric and dielectric properties of nanocrystalline SnO2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance-frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed that dielectric constant (epsilon'), dielectric loss (epsilon ''), loss tangent (tan delta), ac electrical conductivity (sigma) and the electric modulus (M) are strongly frequency dependent. A decrease in frequency accompanied with an increase in epsilon' and epsilon '' values. Whereas, ac electrical conductivity (sigma), real (M-vertical bar) and imaginary parts of electric modulus (M-parallel to) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials. (C) 2010 Elsevier B.V. All rights reserved.
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