期刊
CORROSION SCIENCE
卷 63, 期 -, 页码 148-158出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.corsci.2012.05.022
关键词
Magnesium; XPS; XRD; SEM; Passive films
资金
- National Natural Science Foundation of China [50901082, Y2F2151111]
- International Science & Technology Cooperation Program of China [2011DFA5090]
By means of X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), open circuit potential (OCP) measurement and scanning electronic microscope (SEM), the in situ growth mechanism of the Mg-Al hydrotalcite film has been proposed. The composition and morphology of the films undergo a series of variations during the growth processes. The added Al compounds are a vital contribution to the formation of hydrotalcite. The film formation involves the dissolution of the AZ31 substrate, adsorption of the ions from solution, nucleation of the precursor, followed by the dissolution of Al3+, exchanging of OH- by CO32- and growth of the hydrotalcite film. (C) 2012 Elsevier Ltd. All rights reserved.
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