4.6 Article

Scale-space texture description on SIFT-like textons

期刊

COMPUTER VISION AND IMAGE UNDERSTANDING
卷 116, 期 9, 页码 999-1013

出版社

ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.cviu.2012.05.003

关键词

Texture; Multi-fractal analysis; Image feature; Wavelet tight frame

资金

  1. Program for New Century Excellent Talents in University [NCET-10-0368]
  2. Fundamental Research Funds for the Central Universities [SCUT 2009ZZ0052]
  3. National Nature Science Foundations of China [60603022, 61070091]
  4. European Union
  5. National Science Foundation
  6. Direct For Computer & Info Scie & Enginr
  7. Division Of Computer and Network Systems [1035542] Funding Source: National Science Foundation

向作者/读者索取更多资源

Visual texture is a powerful cue for the semantic description of scene structures that exhibit a high degree of similarity in their image intensity patterns. This paper describes a statistical approach to visual texture description that combines a highly discriminative local feature descriptor with a powerful global statistical descriptor. Based upon a SIFT-like feature descriptor densely estimated at multiple window sizes, a statistical descriptor, called the multi-fractal spectrum (MFS), extracts the power-law behavior of the local feature distributions over scale. Through this combination strong robustness to environmental changes including both geometric and photometric transformations is achieved. Furthermore, to increase the robustness to changes in scale, a multi-scale representation of the multi-fractal spectra under a wavelet tight frame system is derived. The proposed statistical approach is applicable to both static and dynamic textures. Experiments showed that the proposed approach outperforms existing static texture classification methods and is comparable to the top dynamic texture classification techniques. (C) 2012 Elsevier Inc. All rights reserved.

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