4.6 Article

Radiation-induced defects in LiAlO2 crystals: Holes trapped by lithium vacancies and their role in thermoluminescence

期刊

JOURNAL OF LUMINESCENCE
卷 160, 期 -, 页码 43-49

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jlumin.2014.11.018

关键词

Trapped hole center; Radiation-induced defects; EPR; Thermoluminescence

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资金

  1. Defense Threat Reduction Agency [HDTRA1-07-1-0008, BRBAA08-I-2-0128]

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Electron paramagnetic resonance (EPR) is used to identify the primary hole trap in undoped lithium aluminate (LiAlO2) crystals. Our interest in this material arises because it is a candidate for radiation detection applications involving either optically stimulated luminescence (OSL) or thermoluminescence (TL). During an x-ray irradiation at room temperature, holes are trapped at oxygen ions adjacent to lithium vacancies. Large concentrations of these lithium vacancies are introduced into the crystal during growth. With the magnetic field along the [001] direction, the EPR spectrum from these trapped-hole centers consists of eleven lines, evenly spaced but with varying intensities, caused by nearly equal hyperfine interactions with two Al-27 nuclei (I=5/2, 100% abundant). The g matrix is determined from the angular dependence of the EPR spectrum and has principal values of 2.0130, 2.0675, and 2.0015. These g shifts strongly support the model of a hole in a p orbital on an oxygen ion. The adjacent lithium vacancy stabilizes the hole on the oxygen ion. A sequence of pulsed thermal anneals above room temperature shows that the EPR spectrum from the holes trapped adjacent to the lithium vacancies disappears in the 90-120 degrees C range. The thermal decay of these hole centers directly correlates with an intense TL peak near 105 degrees C. Signals at lower magnetic field in the 9.4 GHz EPR spectra suggest that the electron trap associated with this TL peak at 105 degrees C may be a transition-metal-ion impurity, most likely Fe, located at a cation site. Additional less intense TL peaks are observed near 138, 176, and 278 degrees C. (C) 2014 Elsevier B.V. All rights reserved.

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