Dielectric Analysis of Dynamic Fouling Behavior on Surface of Polyethersulfone Composite Ultrafiltration Membrane

A dielectric analysis model for the fouling layer on the polyethersulfone composite ultrafiltration (UF) membrane and solution system, which consists of the solution, concentration polarization layer (CPL), and cake layer, was established by virtue of the interfacial polarization and the electrostatic field theory. The effect of some important parameters, such as the depth, conductivity of CPL, and cake layer, on the dielectric spectroscopy (or dielectric relaxation properties) of the UF system was discussed by the parameter sensitivity analysis and the dielectric measurement. The simulations indicate that the CPL can be created rapidly and the cake layer formation is the dynamic balance process of growth and erosion in the process of UF. The key factor affecting on the dielectric spectrum of UF system is the electrical properties of the CPL and the cake layer. In comparison to the results of dielectric measurement, the simulations indicate that the model proposed in this work is valid and reliable to some degree for describing and explaining the dielectric relaxation phenomenon in UF system. It is very important to further understand the fouling behavior of membrane surface and optimize the controlling techniques of membrane fouling in the process of UF.