Local Electrode Atom Probes

The historical developments leading to the advent of Local Electrode Atom Probes (LEAP) are reviewed. An assessment of the state of the art is made, and the major advantages of LEAPs over conventional atom probes are described. The best implementations of these concepts and the remaining challenges for realization of LEAP's potential are also described. It is concluded that LEAPs should be an important tool for materials characterization at the atomic scale. Modern materials-dependent industries as diverse as steel and microelectronics should benefit from this technology. (C) Elsevier Science Inc., 2000. All rights reserved.