期刊
JOURNAL OF APPLIED PHYSICS
卷 88, 期 5, 页码 2912-2920出版社
AMER INST PHYSICS
DOI: 10.1063/1.1287522
关键词
-
The high-frequency dynamical response of cantilevers used in atomic force microscopy (AFM) to an external force is important for applications such as dynamic AFM modes and dynamic mechanical measurements on biological tissues. In this paper we present a novel method for experimentally determining the mechanical driving-point impedance of an AFM cantilever up to frequencies of at least 70 kHz. A frequency-independent, point force was achieved by applying an electric field between the cantilever and a sharpened steel electrode positioned near (10 mu m) the tip of the cantilever. The velocity of the cantilever in response to the force was measured with a laser interferometer. The method was tested in air and in tetrachloromethane (CCl4), a nonpolar, nondissociating fluid. The results agree with theoretical predictions. In addition, the mechanical impedance of a cantilever near a flat surface was measured. (C) 2000 American Institute of Physics. [S0021- 8979(00)05717-0].
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据