4.6 Article

Electrochemical quartz crystal microbalance study of the electrodeposition mechanisms of Cu2-xSe thin films

期刊

ELECTROCHIMICA ACTA
卷 45, 期 22-23, 页码 3737-3748

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0013-4686(00)00450-3

关键词

copper selenide; thin films; electrodeposition; cyclic voltammetry; electrochemical quartz crystal microbalance

向作者/读者索取更多资源

Electrodeposition mechanisms of Se, Cu and Cu2-xSe thin films were studied by means of the electrochemical quartz crystal microbalance (EQCM). The electrodeposition of Se was found to be faster at higher overpotentials, though with lower apparent efficiency. The formation of Cu2-xSe from a thiocyanate bath was confirmed to proceed via the induced co-deposition mechanism at more positive potentials than where Cu+ alone is reduced. The M/z value corresponding to Cu2-xSe formation first decreased gradually during the cyclic voltammogram, indicating that the previously formed Se film was converted into Cu2-xSe. After the Se film was consumed, the M/z value settled to a constant value, which corresponded to the formation of Cu2-xSe from Cu+ and Se4+ ions. The M/z value was constant over a wide potential range. In contrast, when the Cu2-xSe films were deposited at constant potentials, the M/z value was found to be dependent on the deposition potential. (C) 2000 Elsevier Science Ltd. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据