期刊
JOURNAL OF ELECTRON MICROSCOPY
卷 50, 期 2, 页码 101-104出版社
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/50.2.101
关键词
X-ray emission spectroscopy; transmission electron microscope; DOS of the valence band; soft-X-ray spectrometer; BK-emission spectra; hexagonal boron-nitride
类别
We constructed a grazing-incidence soft-X-ray spectrometer for a transmission electron microscope. The spectrometer, which was composed of a grating and a CCD detector, was attached to a JEM2000FX transmission electron microscope. B It-emission spectra of hexagonal boron-nitride, which give the density of states of the valence band of the material, were obtained with an energy resolution of about 0.6 eV.
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