期刊
IEEE DESIGN & TEST OF COMPUTERS
卷 19, 期 2, 页码 44-48出版社
IEEE COMPUTER SOC
DOI: 10.1109/54.990441
关键词
-
An automatic, wafer-scale, defect cluster identifier finds and marks all defective dies, further automating wafer testing. A prototype tool screens 45,000 wafers, saving a Philips Semiconductor test facility $100,000 in expenses per month.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据