3.8 Article

Mapping of sp(2)/sp(3) in DLC thin film by signal processed ESI series energy-loss image

期刊

JOURNAL OF ELECTRON MICROSCOPY
卷 51, 期 6, 页码 391-400

出版社

OXFORD UNIV PRESS
DOI: 10.1093/jmicro/51.6.391

关键词

electron spectroscopic imaging (ESI); FFT interpolation; maximum entropy deconvolution; wavelet transformation; sp(2)/sp(3) ratio; EELS

向作者/读者索取更多资源

A set of signal processing methods comprising fast Fourier transform interpolation, maximum entropy deconvolution and wavelet transformation has been successfully integrated to improve the equality of the extracted C K-edge spectra from electron spectroscopic imaging (ESI) series. Fast Fourier transform interpolation is used to improve the dispersion arising from discrete sampling of ESI series in the energy space. The maximum entropy method is used to dispel the convolution effect resulting from that ESI series acquired with a finite energy window. Wavelet transformation is applied to de-noise the extracted ESI spectrum. The post-processed ESI spectrum has quality as good as that of a probe-acquired spectrum and makes semi-quantitative analysis of the two-dimensional sp(2)/sp(3) ratio map in diamond-like carbon thin film possible. in general, this method is applicable for reconstructing good quality core-loss electron energy-loss spectra from a nanometre-sized area, so that it may be possible to quantitatively analyse two-dimensional information about electronic structure in materials with near nanometre resolution.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

3.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据