期刊
CERAMICS INTERNATIONAL
卷 38, 期 2, 页码 1115-1126出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2011.08.039
关键词
PZT; Polarization reversal; Switching; Remnant; Loading rate; Temperature
资金
- National Research Foundation of Korea (NRF)
- Ministry of Education, Science and Technology [2011-0005280]
A PZT wafer poled in thickness direction is subject to through-thickness electric field cyclic loads at four different loading rates and four different temperatures. Electric displacement in thickness direction and in-plane extensional strain are measured and plotted during a complete cycle of polarization reversal. Reference remnant polarization and reference remnant in-plane extensional strain are calculated from the measured data. Effects of electric field loading rate and temperature on domain switching process and evolutions of reference remnant state variables are discussed and explained using consecutive two step slow 90 degrees domain switching processes and reduced coercive field at high temperatures. (C) 2011 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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