期刊
MICRON
卷 34, 期 2, 页码 79-83出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0968-4328(03)00019-2
关键词
TEM sample preparation; powders; metallic matrix; cold deformation
类别
In this paper we describe a novel method to prepare powder specimens for transmission electron microscopy examination. The powder samples are embedded in a metallic matrix by a route based on the plastic flow of a soft metal, using a small laboratory type hand driven hydraulic press. The resulting composites are processed with the conventional procedure based on grinding polishing and ion beam milling. The resulting TEM specimens have a self-supporting structure, good thermal and electrical conductivity while showing a well-polished surface resulting from the ion milling process. The method can be applied to a large variety of samples with sufficiently strong mechanical properties; a few examples are reported. The limits, mainly due to the mechanical toughness of the powder, are discussed. (C) 2003 Elsevier Science Ltd. All rights reserved.
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