Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis

Layer-by-layer growth in Fe/Fe(l 0 0) is studied by scanning tunneling microscopy and reflection-high-energy-electron-diffraction (RHEED). In out-of-phase conditions, satellite structures are observed in the room temperature deposition diffraction patterns. With increasing deposition temperature, these satellites are no longer resolved and only contribute to the broadening of the linewidth. They are interpreted in terms of diffuse scattering associated with island distribution on the surface. Their positions directly reflect the average island separation. As a consequence, the temperature dependence of the RHEED profile can then be used to estimate diffusion parameters. (C) 2002 Elsevier Science B.V. All rights reserved.