期刊
MICRON
卷 35, 期 5, 页码 345-360出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.micron.2003.12.002
关键词
electron; nanodiffraction; nanoparticles; scanning transmission electron microscopy
类别
Diffraction patterns from regions 1 nm or less in diameter may be recorded in scanning transmission electron microscopy instruments, and have been applied to the investigation of the structures of various nanoparticles, including catalysts, ferrihydrite and ferritins. Applications to nanotubes and related materials and near-amorphous thin films are reported. The coherence of the incident beams may be exploited in studies of crystals and their defects. Several schemes are outlined whereby the information from sequences of nanodiffraction patterns may be combined to provide ultra-high resolution in electron microscope imaging. (C) 2004 Elsevier Ltd. All rights reserved.
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