期刊
ACTA CRYSTALLOGRAPHICA SECTION A
卷 60, 期 -, 页码 33-39出版社
BLACKWELL MUNKSGAARD
DOI: 10.1107/S0108767303022633
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An experiment is reported on ultra-high-angle double-crystal X-ray diffractometry (U-HADOX) at the Bragg angle theta up to 89.5degrees, coupled with white X-rays from a conventional source. It is shown that the Bragg-peak shift associated with a change in the lattice spacing increases in proportion to tan theta as predicted; the relative accuracy of a change in the spacing to 10(-8) is attained. The performance is demonstrated for the determination of the linear thermal-expansion coefficient alpha of silicon and strontium titanate SrTiO3, a value with four significant figures being determined with the data in a temperature range narrower than 1 K; the value of alpha for silicon (2.621 +/- 0.003) x 10(-6) K-1 at 300.4 K is compared with those in the literature based on experiments using the Bond method of X-ray diffraction and macroscopic thermal expansion. The advantages and characteristics of U-HADOX including the coupling with synchrotron X-rays are discussed.
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