期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 75, 期 1, 页码 124-135出版社
AMER INST PHYSICS
DOI: 10.1063/1.1633001
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A novel low-temperature bolometric method has been devised and implemented for high-precision measurements of the microwave surface resistance of small single-crystal platelet samples having very low absorption, as a continuous function of frequency. The key to the success of this nonresonant method is the in situ use of a normal metal reference sample that calibrates the absolute rf field strength. The sample temperature can be controlled independently of the 1.2 K liquid-helium bath, allowing for measurements of the temperature evolution of the absorption. However, the sensitivity of the instrument decreases at higher temperatures, placing a limit on the useful temperature range. Using this method, the minimum detectable power at 1.3 K is 1.5 pW, corresponding to a surface resistance sensitivity of approximate to1 muOmega for a typical 1 mmx1 mm platelet sample. (C) 2004 American Institute of Physics.
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