X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder

Indium tin oxide films and coatings are widely used and can be produced by different techniques including dip and spin coating of suspensions of nanoparticles. To achieve high-quality films, the nanopowder has to be fully characterized. Hence, three coprecipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in the oxide state; that is, no metallic component could be observed. In addition, measurements by use of X-ray diffraction, scanning electron microscopy/energy dispersive X-ray spectroscopy and transmission electron microscopy were performed. They showed that indium tin oxide primary particles are slightly elliptical and facetted in shape. The powders have a body-centered cubic lattice type, and the lattice parameter is 1.01 nm. Measured by both Xray photoelectron spectroscopy and energy dispersive X-ray spectrometry, the tin content was determined to be 5-6 at.%. (C) 2004 Elsevier Inc. All rights reserved.