Pulsed laser deposition of ferroelectric (Na0.5K0.5)NbO3-based thin films

Ferroelectric (Na0.52K0.44Li0.04)(Nb0.84Ta0.10Sb0.06)O-3 thin films were epitaxially grown on a (100)SrRuO3//(100)SrTiO3 substrate by pulsed laser deposition. Crystallographic analysis of the film was performed using conventional X-ray diffraction analysis and rocking curve measurements. Hi.-h resolution X-ray diffraction reciprocal space map was also measured to analyze the crystallographic relationship between the grown film and the SrTiO3 substrate and to determine the strain state of the film. The full width at half maximum of the rocking curve was as small as 0.19 degrees and the determined pseudo-tetragonal lattice parameters were a = 3.947 angstrom and c = 3.955 angstrom. The P-E hysteresis loop of the film was characteristic of ferroelectric behavior.