期刊
TECHNICAL PHYSICS
卷 50, 期 1, 页码 82-86出版社
MAIK NAUKA/INTERPERIODICA/SPRINGER
DOI: 10.1134/1.1854828
关键词
-
The feasibility of the high-resolution operating mode in a planar multireflection time-of-flight analyzer that is suggested in Part I of this work is demonstrated. Time-of-flight aberrations, which limit the resolution, are estimated. A resolution as high as 200 000 at a time of flight of 70 ms is achieved in experiments. It is shown that the maximal resolution is limited by the duration of the ion packet generated by the source. The resolution can be improved by closing the ion beam trajectory with the formation of repeating cycles. The number of the cycles depends on the beam intensity losses due to scattering by the residual gas. It seem likely that the resolution can be improved further by using a higher vacuum, refining the ion source, and applying more stable power supplies. (C) 2005 Pleiades Publishing, Inc.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据