A technique for measuring the difference between the splay and bend flexoelectric coefficients in a nematic liquid crystal is demonstrated. The method uses the flexoelectric-optic effect, but instead of a uniform lying helix structure, a TN cell geometry with an in-plane electric field is used. This has the advantage of avoiding difficulties associated with aligning the helix and can be used to measure achiral materials. The effects due to ionic screening are also taken into account.
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