Preparation and characterization of indium-doped tin oxide thin films

Hishly transparent and semiconducting indium-doped tin oxide films were prepared by spray pyrolysis. These films were characterized by Xray diffraction. scanning electron microscopy, energy dispersive spectroscopy and optical transmission. X-ray diffraction studies have shown the polycrystalline nature of the films. The preferential orientations as well as the electro-optical properties are sensitive to indium doping. The structural, electrical and optical studies carried out on these films reveal their columnar and compact structure. (c) 2005 Elsevier Ltd and Techna Group S.r.l. All rights reserved.