期刊
MATERIALS LETTERS
卷 61, 期 14-15, 页码 3134-3137出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2006.11.011
关键词
silicon carbide; nanowire; electron holography; electron energy loss spectroscopy
SiC nanowires with modulation in diameter and interior structure along the growth direction have been fabricated via a self-organized process. The SiC nanowires, the basic structure of which is zincblende-type, contain many bunching stacking faults along the growth direction inhomogeneously. In other words, the SiC nanowires consist of alternate stacks of the perfect crystal and the defective regions. We have found the difference in the values of mean inner potential between the perfect crystal and the defective regions by means of electron holography. (c) 2006 Elsevier B.V. All rights reserved.
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