4.4 Article Proceedings Paper

GaN/AlGaN active regions for terahertz quantum cascade lasers grown by low-pressure metal organic vapor deposition

期刊

JOURNAL OF CRYSTAL GROWTH
卷 298, 期 -, 页码 687-690

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2006.10.106

关键词

X-ray diffraction; metal organic chemical vapor deposition; nitrides

向作者/读者索取更多资源

The GaN/AlGaN active regions for terahertz (THz) quantum cascade lasers were grown by metal organic chemical vapor deposition (MOCVD). The surface of the sample was characterized by atomic force microscopy (AFM). The structure of this sample was evaluated by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The XRD pattern and cross-sectional TEM images showed that a well-controlled quantum cascade GaN/AlGaN layers could be prepared. Optical properties of the active region of a terahertz GaN/AlGaN have been investigated by Fourier transform infrared (FTIR) spectrometer. It was found that the frequency of E-1(LO) phonon decreased in quantum cascade GaN/AlGaN structures. The phonon frequency shift could be attributed to the effect of phonon zone folding. (c) 2006 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据