期刊
SURFACE SCIENCE
卷 601, 期 1, 页码 178-187出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2006.09.020
关键词
atomic force microscopy; angle resolved ultraviolet photoelectron spectroscopy; X-ray diffraction; molecular electronics; surface structure, morphology, roughness, and topography; titanium oxide; thiols; organic semiconductors
Growth of sexithiophene films on both ordered and disordered TiO2(110) surfaces has been investigated by angle-resolved ultraviolet photoemission spectroscopy, atomic force microscopy, and X-ray diffraction including grazing-incidence characterization. The order (or disorder) of the TiO2(110)-1 x 1 surface has been observed to profoundly influence the electronic, morphological, and structural properties of the 6T films: the band alignment, which determines the injection efficiency of contacts, has been considerably modified by 0.6 eV, and a morphology with either needle-like or dendritic-like islands has been obtained. The changes in the 6T film properties are associated with the orientational modifications of sexithiophene molecules within the films, either flat-lying or upright standing, 6T(010) or 6T(100) crystallites, respectively. The growth of different crystallite orientations is argued to be controlled by the kinetics mediated by the (dis)-order of the TiO2(110) surface rather than exclusively by chemical interaction between the molecule and the substrate. (c) 2006 Elsevier B.V. All rights reserved.
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