期刊
COLLOID AND POLYMER SCIENCE
卷 286, 期 1, 页码 85-95出版社
SPRINGER
DOI: 10.1007/s00396-007-1791-9
关键词
atomic force microscopy; scanning force microscopy; scanning probe microscopy; contact mode; non-contact mode; tapping mode; physical properties; electrical properties; mechanical properties; magnetic properties; chemical force microscopy; force Spectroscopy; piezoelectricity; electrostriction; magnetostriction
Atomic force microscopy (AFM) has become not only a topographic characterization tool of surfaces at a micro- or nano-level resolution but also a full line of research. From a topographic analysis of a surface to nanolithography or synthesis of particles, the AFM is used on a wide range of applications in physics, materials science, chemistry, and biology. This contribution presents a review of the uses of the instrument and the basic principles and techniques that are available in both static modes and dynamic modes. It focuses on the description of the main physical properties that can be obtained with the AFM and the experimental results of the instrument in materials science, chemistry, and biology.
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