Progress and research at the Shanghai EBIT

In this report, a brief description of the current progress at the Shanghai EBIT project is presented. This is followed by a short discussion of the measurement of various parameters (electron beam diameter and ion density) under a number of operational conditions. A brief introduction to di-electronic recombination measurements for highly ionized xenon is given. Next, we present a preliminary measurement of the time dependence of xenon X-ray emission lines. Finally, a comparison of calculated and experimental charge-state distributions is given. This shows the influence of multi-electron capture and different distributions of the ion cloud on the charge state distribution.