期刊
JOURNAL OF APPLIED PHYSICS
卷 118, 期 15, 页码 -出版社
AIP Publishing
DOI: 10.1063/1.4933289
关键词
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资金
- German Science Foundation through the Cluster of Excellence Center for Advancing Electronics Dresden [ZE 891/1-1]
- German Science Foundation [RTG 1401/2]
Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution. (C) 2015 AIP Publishing LLC.
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