期刊
JOURNAL OF POROUS MATERIALS
卷 7, 期 1-3, 页码 147-152出版社
KLUWER ACADEMIC PUBL
DOI: 10.1023/A:1009617105840
关键词
porous gallium phosphide; photoconductivity; surface recombination; microwave reflectance; TRMC
Using time resolved microwave conductivity experiments, the dynamics of charge carrier recombination in nanoporous GaP was studied. The photoinduced conductivity initially decays very rapidly on a microsecond timescale but slows down by eight orders of magnitude in its final stages. The experimental results can be explained by a model in which charge carrier recombination takes place at the semiconductor surface, the rate being determined by the band bending across the depletion layer. The conductivity response is characteristic for a situation where the typical length scale for the nanoporous semiconductor network (10(-7) m) is comparable to the width of the depletion layer.
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