期刊
APPLIED PHYSICS LETTERS
卷 76, 期 10, 页码 1282-1284出版社
AMER INST PHYSICS
DOI: 10.1063/1.126009
关键词
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Positronium annihilation lifetime spectroscopy is used to determine the pore-size distribution in low-dielectric thin films of mesoporous methylsilsesquioxane. A physical model of positronium trapping and annihilating in isolated pores is presented. The systematic dependence of the deduced pore-size distribution on pore shape/dimensionality and sample temperature is predicted using a simple quantum mechanical calculation of positronium annihilation in a rectangular pore. A comparison with an electron microscope image is presented. (C) 2000 American Institute of Physics. [S0003-6951(00)03810-9].
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