期刊
APPLIED PHYSICS LETTERS
卷 76, 期 11, 页码 1470-1472出版社
AMER INST PHYSICS
DOI: 10.1063/1.126067
关键词
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Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed. (C) 2000 American Institute of Physics. [S0003-6951(00)01011-1].
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