期刊
MATERIALS CHARACTERIZATION
卷 44, 期 4-5, 页码 431-434出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/S1044-5803(00)00084-X
关键词
-
An improved X-ray diffraction rotating orientation measurement method is proposed that can measure the crystal lattice orientation quickly and accurately. The method can also directly assess the quality of preferentially oriented specimens and quasi-single crystals through use of the butterfly diagram to measure the crystal orientation distribution. (C) Elsevier Science Inc., 2000. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据