期刊
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
卷 11, 期 3, 页码 179-198出版社
SPRINGER
DOI: 10.1023/A:1008993813689
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Recently developed direct conversion flat-panel X-ray image detectors provide not only potentially superior images but also enable a simple and convenient means of achieving digital radiography. The present flat-panel sensors use stabilized a-Se as an X-ray photoconductor to convert absorbed X-ray photons to collectable charge carriers. The present paper outlines the basics of the direct conversion flat-panel X-ray detector, formulates and reviews the required X-ray photoconductor properties and examines to what extent stabilized amorphous selenium (a-Se) fulfills these requirements and how it compares with other potential X-ray photoconductors that have been proposed. Charge transport and the electron-hole pair creation energy in stabilized a-Se are reviewed within the context of our present knowledge. Current materials problems and future potential developments are also critically discussed.
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