A photometric technique for film thickness measurements is described in this paper. It is based on the absorption of light passing through a layer of dyed liquid and takes advantage of small sized diode laser sources and sensitive light sensors. The method is non-intrusive, easy to use and to calibrate and can be implemented at relatively low cost. Laboratory tests of the technique have yielded satisfactory accuracy and repeatability. Moreover, the technique allows measurements with a good spatial resolution. Flowing film thickness measurements made photometrically are compared directly to measurements taken simultaneously with a parallel wire conductance probe. Time-averaged film heights, RMS values and other statistical information have been obtained by analyzing these instantaneous film thickness records. With regard to the time-averaged values of liquid film thickness, there is a satisfactory agreement between the two measuring techniques.
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