期刊
APPLIED SURFACE SCIENCE
卷 157, 期 4, 页码 367-372出版社
ELSEVIER
DOI: 10.1016/S0169-4332(99)00552-8
关键词
noncontact atomic-force microscopy; DFT; LDA; Si(111) root 3 X root 3-Ag surface; HCT model; tip-surface interaction force; frequency shift; image
A Fourier expansion method is introduced to simulate the noncontact atomic force microscopy (NC-AFM) images in an efficient way, where three dimensional (3D) tip-surface interaction force distribution calculated by the first-principles density functional (LDA) calculations are fitted to an analytical function. As an example of application of this method, we adopt a Si(111)root 3 X root 3 R30 degrees-Ag surface. Force spectroscopies and 2D images for different tip height are presented. (C) 2000 Elsevier Science B.V. All rights reserved.
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