期刊
APPLIED PHYSICS B-LASERS AND OPTICS
卷 70, 期 4, 页码 587-591出版社
SPRINGER VERLAG
DOI: 10.1007/s003400050866
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We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z = 0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.
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