期刊
PHYSICAL REVIEW LETTERS
卷 84, 期 15, 页码 3398-3401出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.84.3398
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We report measurements of nonequilibrium noise in a diffusive normal metal-superconductor (N-S) junction in the presence of both de bias and, high-frequency ac excitation. We find that the shot noise of a diffusive N-S junction is doubled compared to a normal diffusive conductor. Under ac excitation of frequency nu the shot noise develops features at bias voltages \ V \ = h nu/(2e), which bear all the hallmarks of a photon-assisted process. Observation of these features provides clear evidence that the effective charge of the current carriers is 2e, due to Andreev reflection.
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