期刊
PHYSICAL REVIEW B
卷 61, 期 15, 页码 9968-9971出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.61.9968
关键词
-
Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift Delta f of an oscillating cantilever with eigenfrequency f(0). spring constant k and amplitude A, which is subject to tip-sample forces F-ts. Here, we present analytical results of Delta f(f(0),k,A) for several basic classes of F-ts. With these results, a method to calculate images is derived and demonstrated with an example.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据