期刊
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
卷 69, 期 5, 页码 1558-1565出版社
PHYSICAL SOC JAPAN
DOI: 10.1143/JPSJ.69.1558
关键词
resonant X-ray emission; polarization dependence; ScF3; TiO2; covalency hybridization; Wigner-Eckart theorem
We measure 2p --> 3d --> 2p resonant X-ray emission spectra (RXES) of d(0) system (ScF3 and TiO2) and analyze them by means of MX6 (M=Sc or Ti, X=F or O, respectively) cluster model with full multiplet effects. We treat the whole RXES process as a coherent second order optical process and take the polarization dependence into account. The strong polarization dependence of the inelastic peak is clearly seen both in the experimental and calculated results, In order to clarity it, we investigate the detailed mechanism of the polarization dependent RXES by the total energy level diagram and the group theoretical consideration.
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