期刊
JOURNAL OF APPLIED PHYSICS
卷 87, 期 9, 页码 5472-5474出版社
AMER INST PHYSICS
DOI: 10.1063/1.373376
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The magnetic domain structure in thin ferromagnetic films with perpendicular anisotropy is investigated. The effect of an in-plane magnetic field on the presence of domains and the magnetization profile is analyzed within the framework of a one-dimensional analytical model. The general results are reported in a state diagram as a function of the two relevant dimensionless parameters: the quality factor and the ratio of the film thickness to the exchange length. The experimental results, including hysteresis measurements, magnetic force microscopy, and x-ray resonant magnetic scattering obtained on a generic FePd thin layer, are reported and compared to the model. (C) 2000 American Institute of Physics. [S0021-8979(00)65508-1].
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